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Field
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lithography, grayscale lithography, ion etching, wet chemistry, deposition, and surface metrology such as ellipsometry, electron microscopy, and atomic force microscopy. It is expected that the candidate will
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conditions, avoiding any air exposure prior to ions or plasma. A series of surface science and plasma techniques, including X-ray Photoelectron Spectroscopy (XPS), in-situ Spectroscopic Ellipsometry, gas-phase
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Warsaw University of Technology/Centre for Advanced Materials and Technologies, CEZAMAT | Poland | about 2 months ago
, lithography, plasma deposition, and thermal processes Development and execution of inter-process inspections, including scanning electron microscopy, optical microscopy, atomic force microscopy, ellipsometry
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limited to ICP and RIE etchers, PECVD, LPCVD and PVD as well as ALD and relevant in-line characterization equipment (SEM, AFM, XRD, XPS, ellipsometry). You will interact with and advise both academic and
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PhD in Optical Characterization and Photonic Performance Analysis of Liquid Crystal Polymer Coatings
; measure angle-dependent reflection, transmission, haze, scattering, polarization selectivity, and spectral bandwidth; perform UV-Vis-NIR spectroscopy, polarized optical microscopy, ellipsometry, Mueller
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test substrates. You will measure the optical, structural, and electrical properties of the layers using ellipsometry, UV-vis spectroscopy, and IV measurements. You will integrate the developed layers
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-throughput characterization methods include spectroscopy, optical and scanned probe microscopy, scattering, reflectivity, ellipsometry, and contact angle measurements. See http://www.nist.gov/mml/polymers
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interfaces in Li-ion rechargeable batteries. These techniques include optical in situ characterization methods such as, Raman, FTIR spectroscopy/microscopy, ellipsometry, TERS, near-field nano-FTIR techniques
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infrared spectroscopy, spectroscopic ellipsometry, contact angle measurements, and atomic force microscopy. Key aspects of this work involve examination and optimization of alternative functionalization
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, ellipsometry, comprehensive photovoltaic parameter measurements) in peer-reviewed scientific publications, including descriptions of applied techniques and data analysis. Participation in European