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-interferometry, AFM, SEM, Photoelectron and Raman spectroscopy, and Spectroscopic Ellipsometry Develop expertise in cleaning optics, removal of mirror coatings & refurbishments: determine the suitability of
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, semiconductor materials or optoelectronic devices. Experience with materials characterization techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell
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techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell characterization (J-V, EQE, stability testing) is considered an advantage. Excellent
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nanomaterials characterization • Hands-on experience with one or more advanced characterization techniques, ideally including atomic force microscopy, ellipsometry, infrared or Raman spectroscopy, light and X-ray
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 19 days ago
, and dry etching. Proficiency in thin-film characterization and metrology using SEM, AFM, and ellipsometry is required. Characterization skills must include sensitive hands-on experience with fiber