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Field
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Center of Excellence in Nano Imaging (CNI), a shared instrumentation facility serving researchers across engineering and the physical and life sciences. The Staff Scientist provides scientific and
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. About You You should demonstrate extensive experience of STEM characterisation of electron beam sensitive materials, including imaging, diffraction and spectroscopy, with experience of acquiring 4
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advanced correlative microscopy techniques, combining coherent X-ray diffraction imaging (CXDI) and STED super-resolution microscopy. The researcher will: • Develop new multimodal imaging strategies; • Work
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diffraction imaging modalities - topotomography, dark-field X-ray microscopy, and Bragg coherent diffraction imaging - has emerged over the past decade that can resolve 3D defect architectures and strain fields
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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | 16 days ago
that typical experimental characterization methods (e.g., electron backscatter diffraction, digital image correlation) provide only surface-level grain structure information, while the subsurface
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diffraction patterns alone, bypassing projection reconstruction? Can we reliably identify defects without ever resolving them? What is the best way to incorporate the known design information into the imaging
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-resolution imaging at the micron scale remains hindered by limitations imposed by its sub-millimeter wavelengths [1 THz ~ 300 µm]. This necessitates the need to transcend the diffraction limit of THz waves
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synchrotron or laboratory 3D diffraction imaging is considered as a significant advantage. Excellent English communication skills are also essential As a formal qualification, you must hold a PhD degree (or
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into igneous crystal textures using electron backscatter diffraction (EBSD). This is a fixed term (six months), part-time position (0.5 FTE, 17.5 hours per week). The successful candidate will work closely with
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. Research activities may include in-situ and ex-situ ion irradiation, corrosion and environmental testing, nano-indentation, transmission and scanning electron microscopy, electron backscatter diffraction