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the specificity of IR spectroscopy with the resolution of AFM, enabling IR analysis with a spatial resolution smaller than the optical diffraction limit (< 10 nm at 300 K, < 0.1 nm the goal of this project). STML
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of industrially relevant material surfaces where the machine learning is driven by in situ XAS, XRF, and XRD measurements References: “On-the-fly segmentation approaches for x-ray diffraction datasets for metallic
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that contributes to reliable manufacturing of the next generation computing devices. Computational imaging methods such as coherent diffractive imaging, Fourier ptychography, structured illumination techniques, and
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of novel optical methods for nanoscale dimensional measurements using the NIST 193 nm Microscope: a newly upgraded, custom-built, world-class high-magnification optical imaging platform optimized
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Imaging Facility, which includes a spherical-aberration corrected transmission electron microscope (TEM), a three-dimensional atom probe, a helium-ion microscope, and a focused-ion beam microscope. Our
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in magnetic resonance imaging (MRI), hyperthermia for cancer and arthritis treatment, and drug delivery. However, the fundamental characterization methods for magnetic nanoparticles-both individually
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bars (Kolsky bars), and instrumented hardness machines (Vickers and nanohardness) will be employed. Real-time surface deformation will also be captured using Digital Image Correlation (DIC) and
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microscope (STEM) image. This is a fundamental transformation from the existing image acquisition paradigm and could enable new types of nano- and atomic-scale metrology. The Material Measurement Laboratory
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there is interest in expanding to include inverse methods based on model-inspired analysis of experimental data by itself. Additional data streams from infrared imaging and diffraction stress measurements
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magnetic hardness, giant magnetoresistance effects, spintronics, magnetic nanoparticles for medical imaging and disease treatment, ferromagnetism in semiconductors, optical transparency in ferromagnets