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diffraction, x-ray absorption spectroscopy for the quantification of chemical short range order, and automated microstructural image analysis. The simulation approaches of interest include machine learning
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, powder characterization techniques such as dynamic image analysis, high-speed micro-videography in both infrared and visible spectra, and in-situ synchrotron X-ray imaging and diffraction. We have ongoing
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on the design and fabrication of prototype nanostructure electronic devices such as FinFETs for applications in high power electronics. We welcome proposals aimed at new technological aspects of semiconductor
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-projects/nanoscale-imaging-and-spectroscopy-ir-nir-vis-beyond-diffraction-limit ) and/or applying PTR on specific materials or nano systems with efforts balanced based on candidate interests and expertise
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collaborations. key words Aluminum; Dual phase steel; Forming; Orientation imaging microscopy; Plasticity models; TRIP steel; X-ray diffraction; Yield loci; Yield surface; Eligibility citizenship Open to U.S