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than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology Mission
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advanced correlative microscopy techniques, combining coherent X-ray diffraction imaging (CXDI) and STED super-resolution microscopy. The researcher will: • Develop new multimodal imaging strategies; • Work
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, Raman spectroscopy, X-ray diffraction, thermal analysis, etc.), electrode fabrication, cell assembly and electrochemical testing. A full suite of electron microscopy (SEM and TEM) and surface analysis
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significant experience and expertise in air-free synthetic methods (e.g., Schlenk and glovebox techniques), crystal growth and analysis using single-crystal X-ray diffraction, and spectroscopic characterization
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to optimize performances. The postdoc will carry out structural and morphological characterizations (X-ray diffraction, TOF-SIMS, AFM, and microscopy) of the selected superconducting materials. In the second
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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interprets experimental structural data from amorphous thin films, including X-ray total-scattering, pair-distribution-function (PDF), and related diffraction/scattering measurements, and integrate
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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | about 1 month ago
characterization of metallic materials (e.g., synchrotron X-ray diffraction, computed tomography, electron backscatter diffraction, digital image correlation). Point of Contact Mikeala Eligibility Requirements
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. The postdoc will analyze the phase and composition of their reaction products using techniques spanning X-ray diffraction, energy dispersive X-ray spectroscopy, electron microscopy, and calorimetry. The postdoc
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by NMR, UV-Vis, or potentiometric titration. Proficiency in structural characterization by single-crystal and powder X-ray diffraction. Experience with determination of binding constants by NMR, UV-Vos