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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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, and in-situ X-ray diffraction; and evaluates phase transformations and microstructure-property relationships. Analyzes data, prepares reports, publications, presentations, and research deliverables
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significant experience and expertise in air-free synthetic methods (e.g., Schlenk and glovebox techniques), crystal growth and analysis using single-crystal X-ray diffraction, and spectroscopic characterization
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diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), electrochemical impedance spectroscopy (EIS), and cyclic voltammetry (CV
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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | 22 days ago
characterization of metallic materials (e.g., synchrotron X-ray diffraction, computed tomography, electron backscatter diffraction, digital image correlation). Point of Contact Mikeala Eligibility Requirements
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. The postdoc will analyze the phase and composition of their reaction products using techniques spanning X-ray diffraction, energy dispersive X-ray spectroscopy, electron microscopy, and calorimetry. The postdoc
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collaborative research in a multidisciplinary environment. Experience with analytical tools such as X-ray diffraction, SEM/TEM, FTIR, and Raman spectroscopy. Ability to communicate effectively and on a timely
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, heating technologies. Experience with analytical tools such as X-ray diffraction, SEM/TEM, FTIR, and Raman spectroscopy. Ability to conduct both independent and collaborative research in a multidisciplinary
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substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. Characterize grown material using techniques such as x-ray diffraction, phase
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. • Systematically optimize substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. • Characterize grown material using techniques such as x-ray