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characterisation facilities at Manchester and the Royce Institute. Significant dedicated time has been secured on instruments, including high-resolution SEM, TEM, EBSD, EDS, and XRD. This means you will not only
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optical and spectroscopic characterization techniques such as AFM, SEM and TEM as well as XPS to characterize the deposited metallic thin film in depth. Investigating the developed electrodeposition
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techniques such as scanning electron microscopy (SEM), Transmission electron microscopy (TEM) and X-ray diffraction (XRD) to study the materials at the microscale and nanoscale) as well as access to National
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functionalization. Chemical characterization by different means (FTIR, UV-Vis, electron microscopies, TGA, NMR, EPR and elemental analysis, among others). Morphological characteriztion electron microscopy, (SEM, TEM
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electron (TE) imaging, which can only be done through a large, expensive, and highly specialized (Scanning) Transmission Electron Microscopes ((S)TEM). The aim of this project is to "democratize
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degree (300 ETCS in total). - Knowledge in nanomaterials and nanoscience. - Knowledge of experimental techniques (sputtering, XRD, TEM, SEM, magnetometry, etc.). - Outstanding CV and, more importantly, a
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APT, TEM, FIM, EBIC, EBSD, XPS Kelvin probe microscopy, machine learning augmented analysis techniques) Experimental and computational analysis of transport and the reaction of surfaces and particles