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Evolution Under Ion Irradiation using transmission electron microscopy. In situ transmission electron microscopy (TEM) is a powerful characterization technique that can be used to provide a comprehensive
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nanostructures—developed for tunable Josephson junctions in quantum devices—using high-resolution transmission electron microscopy (TEM). Currently, quantum processors suffer from short coherence times due
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emission spectroscopy and Langmuir probes, coupled with ex situ analysis (SEM, TEM), will be employed to obtain a comprehensive understanding of the physical and chemical properties of the coatings and the
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, numerical process simulation, and advanced characterization techniques (synchrotron, TEM, EBSD), will be implemented. The ideal candidate will hold a Master's degree or an engineering degree in Materials