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microstructural characterization: Operation and analysis using advanced analytical techniques (GISAXS, GIWAXS, TEM, SCLC experiments) to correlate the evolution of semiparacrystalline (SPC) morphology with device
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, 2028 730 days Advanced microstructural characterization: Operation and analysis using advanced analytical techniques (GISAXS, GIWAXS, TEM, SCLC experiments) to correlate the evolution
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functionalization. Chemical characterization by different means (FTIR, UV-Vis, electron microscopies, TGA, NMR, EPR and elemental analysis, among others). Morphological characteriztion electron microscopy, (SEM, TEM
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degree (300 ETCS in total). - Knowledge in nanomaterials and nanoscience. - Knowledge of experimental techniques (sputtering, XRD, TEM, SEM, magnetometry, etc.). - Outstanding CV and, more importantly, a