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provide improved techniques and/or methods. We work heavily with industrial and academic partners to improve these measurements. Crystallographic texture; Phase fraction; Electron backscatter diffraction
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words Strain Measurement; High-Resolution Electron Backscatter Diffraction (EBSD); Transmission Kikuchi Diffraction (TKD) Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral
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Crystallographic investigation of novel materials using Neutron and X-ray diffraction and vibrational spectroscopy NIST only participates in the February and August reviews. Neutron and X-ray
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.B1995 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Hui Wu [email protected] 301 975 2387 Description We develop and study new materials for carbon
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characterization techniques to determine processing-structure-property relations that occur during processing, including scanning and transmission electron microscopy, thermal analysis, and x-ray diffraction
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Nanoscale Spectroscopy (AFM-IR, PTIR, STML) for Strongly Correlated Materials at Cryogenic Temperatures NIST only participates in the February and August reviews. Strongly correlated electrons in
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facilities also include more traditional metallurgical instruments including light optical microscopy, scanning electron microscopy with EBSD and ECCI capabilities, TEM, and x-ray diffraction, as
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Characterization Division opportunity location 50.68.03.C0861 Gaithersburg, MD 20899 NIST only participates in the February and August reviews. Advisers name email phone Martin Yeungjoon Sohn [email protected]
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, polycrystals, pure metals, and alloys. key words Atomic force microscopy; Dislocations; Scanning electron microscopy; Transmission electron microscopy; Work hardening; X-ray diffraction; Eligibility citizenship
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thermography to investigate material behavior under various loading conditions. Microstructural analysis will be conducted using advanced techniques such as scanning electron microscopy (SEM), electron