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Field
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Infrastructure? No Offer Description Area of research: PHD Thesis Job description:PhD Position - 3D electron diffraction of magnetism and structural disorder in NiO The Ernst Ruska-Centre for Microscopy and
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researcher will also work in collaboration with staff from the ICS's electron microscopy and X-ray diffraction platforms. The IT infrastructure will also include workstations fitted with state-of-the-art
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treatments, and mechanical testing; characterizes microstructure using scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), transmission microscopy (TEM/STEM), STEM-EELS, in-situ TEM
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chemistry and flexibility in molecular crystals. You will undertake original research spanning molecular synthesis, crystal growth and advanced characterisation, while building experience in diffraction
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field assisted sintering, additive manufacturing, powder X-ray diffraction, atomic force and electron microscopy and magnetic measurement facilities. The role centres on manufacturing routes for novel
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field assisted sintering, additive manufacturing, powder X-ray diffraction, atomic force and electron microscopy and magnetic measurement facilities. The role centres on manufacturing routes for novel
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Requisition Id 17002 Overview: We are seeking two Computational Instrument Scientists who will focus on developing software analysis tools for the diffraction instruments. These positions reside in
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. About You You should demonstrate extensive experience of STEM characterisation of electron beam sensitive materials, including imaging, diffraction and spectroscopy, with experience of acquiring 4
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relevant experience (or information embedded in email). Curriculum vitae. Contact information for three references. The Department of Mechanical Engineering at the University of Michigan invites applications
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Research Associate (Materials Science & Engineering / Mechanical Engineering / Chemical Engineering)
the industrial translation of our research outcomes. Key Responsibilities: Material Characterizations: Conduct microstructural analysis using Scanning Electron Microscopy (SEM), Electron Backscatter Diffraction