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Field
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understanding of Gaussian beam propagation, diffraction, focusing, imaging, and optical beam characterization. Experience working with semiconductor lasers, laser sources, and associated optical components
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modelling, simulation studies for metal hydrides employed hydrogen tanks, use of high-energy milling and different characterization techniques, including thermogravimetry, X-ray diffraction, X-ray
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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), Quantitative Evaluation of Materials by Scanning Electron Microscopy (QEMSCAN), X-ray Diffraction (XRD), Visible and Short Wave Infrared Spectroscopy (VIS-SWIR), Laser-Induced Breakdown Spectroscopy (LIBS), X
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spectroscopy). Knowledge of thin-film and materials characterization techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, atomic force microscopy, and scanning electron microscopy is required
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-like electronic materials could be built from two of the most abundant elements on Earth? We are looking for a postdoctoral researcher to lead the experimental side of that effort. About the project We
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Requisition Id 16974 Overview: We are seeking a Postdoctoral Research Associate to conduct Mechanical Behavior of Advanced Structural Alloys by Engineering Diffraction. This position resides in
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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | about 1 month ago
that typical experimental characterization methods (e.g., electron backscatter diffraction, digital image correlation) provide only surface-level grain structure information, while the subsurface
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. Perform comprehensive material characterization—including optical and electron microscopy, X-ray diffraction, inductive heating, magnetometry, scanning probe analysis, and other techniques based on project
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processing and phase transformation. The candidate will work with experimental datasets from techniques such as electron microscopy, EBSD, X-ray diffraction, X-ray imaging and in situ characterisation