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RAP opportunity at National Institute of Standards and Technology NIST Modeling for Quantitative Scanning Electron Microscopy Location Physical Measurement Laboratory, Microsystems and
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RAP opportunity at National Institute of Standards and Technology NIST Compressive Sensing Methods for Electron Microscopy and Microanalysis Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Four-Dimensional (4D) Scanning Transmission Electron Microscopy Location Material Measurement Laboratory, Materials
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Scott MC, et al: Nature 483: 444, 2012 Electron microscopy; TEM; STEM; Tomography; Nanotechnology; Nanocharacterization; EELS; EDS; HAADF;
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RAP opportunity at National Institute of Standards and Technology NIST AI/ML on facility-scale electron microscopy data Location Laboratory Programs, Research Data and Computing Office
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NIST only participates in the February and August reviews. Photoelectron spectroscopy (XPS, AES, XAS) and microscopy (PEEM, LEEM, SEM, SPEM) are in high demand for exploring morphologically and
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-of-the-art superconducting qubits, and the Quantitative Nanostructure Characterization Group, who are experts in (scanning) transmission electron microscopy ((S)TEM) characterization of materials. Our
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Nanoscale Spectroscopy (AFM-IR, PTIR, STML) for Strongly Correlated Materials at Cryogenic Temperatures NIST only participates in the February and August reviews. Strongly correlated electrons in
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: Thank you for your interest in this research opportunity. For more information, please email [email protected]. References: [1] Accurate localization microscopy by intrinsic aberration calibration, C. R
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force microscopy, electric force microscopy, laser scanning confocal microscopy and scanning electron microscopy) and spectroscopic (infrared microscope, Raman microscope, fluorescence microscope, ultra