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Field
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, including textural characterization, powder X-ray diffraction, electron microscopy, and other spectroscopic analyses. Demonstrated experience executing catalytic reactions with solid catalysts in batch and/or
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, Raman spectroscopy, X-ray diffraction, thermal analysis, etc.), electrode fabrication, cell assembly and electrochemical testing. A full suite of electron microscopy (SEM and TEM) and surface analysis
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group at C2N. - characterisation of the doping profile and structural properties of the superconducting films and devices using X-ray diffraction (XRD), transmission electron microscopy (TEM), and
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breakdown or electromigration). Compared to other imaging modalities such as electron microscopy, X-ray microscopy is non-destructive and hence ideally suited for in-situ and operando 3D imaging. However, at
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breakdown or electromigration). Compared to other imaging modalities such as electron microscopy, X-ray microscopy is non-destructive and hence ideally suited for in-situ and operando 3D imaging. However, at
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. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform infrared
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-tube synthesis, mechanical alloying, spark plasma sintering); • Crystal structure determination and microstructural characterization (X-ray diffraction, electron microscopy, spectroscopy
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subject. Proven experience with X-ray imaging/diffraction techniques, e.g. XRD-CT, 3D-XRD, µ/nanoCT, STXM or similar. Experience in computer programming for data analysis, e.g. Python. Demonstrated ability
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particularly valuable. Documented experience in materials characterization, such as NMR spectroscopy, mass spectrometry, X-ray diffraction, X-ray photoelectron spectroscopy, vibrational spectroscopy, and
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, material science and advanced analytical techniques (e.g. state-of-the-art liquid and solid-state NMR techniques, X-ray diffraction, transmission electron microscopy, etc). The position involves