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-based techniques (ARPES, XPS) is highly desirable • Familiarity with DFT calculations would be regarded as an extra merit. APPLICATION INSTRUCTIONS: Please submit the following materials through
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microscopy, and conductive force microscopy); surface characterization (XPS), advanced computing concepts (neuromorhpic, stochastic, probabilistic); data security; energy-efficient information technologies
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characterisation tools (Raman, AFM, SEM, TGA, DLS, spectrophotometry, electron microscopy, HPLC, XPS) Good understanding of scientific data plotting and statistical data analysis IT tools (Origin Pro, Graph Pad
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relevant to have experience with analysis techniques such as AFM, WLI, contact-angle, XPS, infrared metrology. You will work in the XUV Optics group at the University of Twente, embedded in the MESA
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. soils, plants, subaquatic sediments or similar matrices) Strong laboratory skills and a working knowledge of other solid phase characterization methods for metals (e.g. XRD, FTIR, XPS, SEM/TEM, ICP-MS
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(XRD, SEM, TEM, XPS, etc.). · Collaborate with interdisciplinary teams and industry partners. · Publish high-impact research in peer-reviewed journals and present findings at conferences. Qualifications
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materials characterization, including: electrochemical characterization, Battery performance test, CV, EIS, Raman, XPS, SEM, and piezoelectricity Electrical testing, including IV measurement, piezoelectricity
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/MS and Q-TOF-MS); experience in material synthesis, surface functionalization, and characterization (FT-IR, XPS, TEM); a strong track record of refereed journal publications; and the ability to work