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microscopy, and conductive force microscopy); surface characterization (XPS), advanced computing concepts (neuromorhpic, stochastic, probabilistic); data security; energy-efficient information technologies
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characterisation tools (Raman, AFM, SEM, TGA, DLS, spectrophotometry, electron microscopy, HPLC, XPS) Good understanding of scientific data plotting and statistical data analysis IT tools (Origin Pro, Graph Pad
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