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National Laboratory to accelerate materials discovery by integrating advanced 3D X-ray diffraction experiments, mechanistic modeling, and artificial intelligence. A powerful set of high-resolution 3D X-ray
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; • Knowledge of advanced characterization techniques such as X-ray diffraction, electron microscopy, optical spectroscopy (e.g. absorption/reflectance, PL, Raman spectroscopy), profilometry, contact angle
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interfaces and macromolecules (including polymers and proteins), using X-ray surface scattering techniques. Together with the beamline scientists, you will contribute to developing advanced, chemically and
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Crystallography Facility (XRCF) to lead technical operations, scientific services, and educational missions in single-crystal and powder X-ray diffraction, pursuing new campus users, new equipment, and new
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partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction and synchrotron-based experiments, in
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, Department of Civil and Mechanical Engineering, Section for Manufacturing Engineering, has a vacant postdoc position within the EIC Transition project Laboratory 4 Dimensional X-ray Diffraction for Sustainable
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development. Preferred Qualifications: Experience with diffraction for materials analysis using either x-rays or neutrons Experience developing diffraction software and/or reverse Monte Carlo software. Previous
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advanced correlative microscopy techniques, combining coherent X-ray diffraction imaging (CXDI) and STED super-resolution microscopy. The researcher will: • Develop new multimodal imaging strategies; • Work
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significant experience and expertise in air-free synthetic methods (e.g., Schlenk and glovebox techniques), crystal growth and analysis using single-crystal X-ray diffraction, and spectroscopic characterization
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, Raman spectroscopy, X-ray diffraction, thermal analysis, etc.), electrode fabrication, cell assembly and electrochemical testing. A full suite of electron microscopy (SEM and TEM) and surface analysis