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to optimize performances. The postdoc will carry out structural and morphological characterizations (X-ray diffraction, TOF-SIMS, AFM, and microscopy) of the selected superconducting materials. In the second
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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | 19 days ago
characterization of metallic materials (e.g., synchrotron X-ray diffraction, computed tomography, electron backscatter diffraction, digital image correlation). Point of Contact Mikeala Eligibility Requirements
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. The postdoc will analyze the phase and composition of their reaction products using techniques spanning X-ray diffraction, energy dispersive X-ray spectroscopy, electron microscopy, and calorimetry. The postdoc
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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collaborative research in a multidisciplinary environment. Experience with analytical tools such as X-ray diffraction, SEM/TEM, FTIR, and Raman spectroscopy. Ability to communicate effectively and on a timely
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, heating technologies. Experience with analytical tools such as X-ray diffraction, SEM/TEM, FTIR, and Raman spectroscopy. Ability to conduct both independent and collaborative research in a multidisciplinary
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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. Characterize grown material using techniques such as x-ray diffraction, phase
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structure to detect nanoscale sample changes from the smallest possible number of X-ray measurements. Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume
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. • Systematically optimize substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. • Characterize grown material using techniques such as x-ray