Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Employer
- MOHAMMED VI POLYTECHNIC UNIVERSITY
- Argonne
- Oak Ridge National Laboratory
- CNRS
- King Abdullah University of Science and Technology
- Delft University of Technology (TU Delft)
- University of Kentucky
- AALTO UNIVERSITY
- Boise State University
- Carnegie Mellon University
- Cornell University
- FAPESP - São Paulo Research Foundation
- ICN2
- Iowa State University
- National Aeronautics and Space Administration (NASA)
- Pennsylvania State University
- University of Central Florida
- University of Copenhagen
- University of Minnesota
- University of North Texas at Dallas
- AGH University of Krakow
- Aalborg University
- Adam Mickiewicz University, Poznań
- BAM Bundesanstalt für Materialforschung und -prüfung
- CEA
- Claremont McKenna College
- Drexel University
- Empa
- Helmholtz-Zentrum Berlin für Materialien und Energie
- Instituto Politécnico de Bragança
- Instituto Superior Técnico
- International Iberian Nanotechnology Laboratory (INL)
- Ivo Pilar Institute of Social Sciences
- Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences
- KTH Royal Institute of Technology
- KU LEUVEN
- Lawrence Berkeley National Laboratory
- Linköping University
- Michigan Technological University
- National Energy Technology Laboratory (NETL)
- Princeton University
- Queen Mary University of London
- Queen Mary University of London;
- St Jude Children's Research Hospital
- Stanford University
- The University of Arizona
- UNIOVI
- Universitat Rovira i Virgili
- Universite de Montpellier
- University of California Irvine
- University of Deusto
- University of Florida
- University of Lund
- University of North Carolina at Chapel Hill
- University of Oregon
- University of Oxford
- University of Warsaw
- Uppsala universitet
- Yale University
- Łukasiewicz Research Network - Krakow Institute of Technology
- 50 more »
- « less
-
Field
-
of the produced powders and films: SEM/EDS, TEM, XRD, ICP-OES, EBSD, etc. Correlate material morphology and composition with final TE material and device performance. Develop TE devices optimized for both energy
-
Diffractometer, Rigaku XtaLAB Synergy-I Single Crystal X-ray Diffractometer, JOEL SEM, DRIFTS, Micromeritics ASAP2020, ASAP2020 Plus, 3FLEX Gas Sorption Analyzer, HPVA-II High-Pressure Gas Sorption Apparatus, DVS
-
University of North Carolina at Chapel Hill | Chapel Hill, North Carolina | United States | about 1 month ago
mechanisms at elevated temperature. Experience with standard materials characterization (XRD, SEM/EDS, XPS, TGA/DSC). Ability to work independently in a glovebox and dry room environment while following
-
perovskite precursor ink formulations and nucleation/crystallization processes Have significant experience performing thin-film and solution metrology and analyzing data from: XRD, SEM, NMR, FTIR, UV-vis, and
-
materials characterization (XRD, Raman, SEM-EDS, TGA, PSD, BET, ICP). Apply Design of Experiments (DoE) and statistical optimization tools to improve processes within the main project and across other ongoing
-
scaleup data, and support techno-economic and sustainability assessments when appropriate. 4. Characterize feed materials, intermediates, and products using appropriate analytical tools, such as, XRD, SEM
-
for conducting a wide variety of experimental tasks, including (but not limited to) mechanical testing (including fracture and fatigue), advanced materials characterisation (including SEM and EBSD), hydrogen
-
. Other Geosciences facilities include state-of-the-art TIMS instrumentation, stable isotope analytical facilities, a benchtop SEM, and rock and mineral preparation and separation equipment. Level Scope
-
characterization of complex materials and multi-component solutions. Practical knowledge of structural and spectroscopic techniques for material and solution analysis (FTIR, XRD, SEM/EDS, ICP, HPLC). Insight
-
of MOF-guest interactions, advanced characterization of MOF materials using techniques such as PXRD, Raman and infrared spectroscopy, UV-vis spectroscopy, XPS, SEM, and TEM, environmental impact assessment