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- MOHAMMED VI POLYTECHNIC UNIVERSITY
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Field
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and spectroscopic techniques for material and solution analysis (FTIR, XRD, SEM/EDS, ICP, HPLC). Insight into acid–base and solution equilibria, speciation, and selectivity in chemically complex media
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characterization techniques such as DSC, FTIR, TGA, DMA, EDS, XRD, Rheology, SEM, and optical microscopy. An excellent record of productive and creative research as demonstrated by publications in peer-reviewed
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other techniques. Development of advanced spectroscopic characterization methodologies (IR, Raman, UV, NMR). - Synthesis, modification, and physicochemical characterization (XRD, TGA, SEM) of nanoporous
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SEM. Skill in devising and performing experiments to acquire data, using and maintaining research equipment, compiling, evaluating, and reporting test results. Problem-solving skills, including
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Experience in the physical characterization of materials (e.g., SEM/TEM, UV-Vis, Raman, etc.), particularly XRD and XRF Advanced skills in interpreting and presenting scientific results Strong communication
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/Qualifications - Demonstrated expertise in advanced statistical techniques, such as: Multilevel modeling (HLM, mixed-effects models) Longitudinal and panel data analysis Structural equation modeling (SEM) Causal
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interventions. Excellent command of advanced statistical methods, including longitudinal data analysis and complex multivariate analyses (e.g., structural equation modelling, SEM). Experience working
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, or gel-polymer systems Experience with organic electrode materials, metal-organic frameworks (MOFs), or coordination polymers. Familiarity with advanced characterisation techniques such as XPS, SEM/TEM
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surface characterization of membranes, coatings, and membrane– coating systems using techniques such as SEM, AFM, FTIR, thermal analysis, and contact angle measurements. • Evaluation of the gas permeation
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supramolecular systems and of stimuli-responsive (e.g. photoswitchable) properties; familiarity with structural characterization of materials using X-ray (e.g. XRD, SAXS, WAXS) and/or microscopy (TEM, SEM, AFM