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, Department of Civil and Mechanical Engineering, Section for Manufacturing Engineering, has a vacant postdoc position within the EIC Transition project Laboratory 4 Dimensional X-ray Diffraction for Sustainable
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to optimize performances. The postdoc will carry out structural and morphological characterizations (X-ray diffraction, TOF-SIMS, AFM, and microscopy) of the selected superconducting materials. In the second
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interfaces and macromolecules (including polymers and proteins), using X-ray surface scattering techniques. Together with the beamline scientists, you will contribute to developing advanced, chemically and
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, Raman spectroscopy, X-ray diffraction, thermal analysis, etc.), electrode fabrication, cell assembly and electrochemical testing. A full suite of electron microscopy (SEM and TEM) and surface analysis
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National Laboratory to accelerate materials discovery by integrating advanced 3D X-ray diffraction experiments, mechanistic modeling, and artificial intelligence. A powerful set of high-resolution 3D X-ray
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We are seeking a highly motivated candidate with expertise in single-crystal X-ray diffraction (SCXRD) for a two-year postdoctoral position in materials science at the DanMAX and SINCRYS beamlines
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. The postdoc will analyze the phase and composition of their reaction products using techniques spanning X-ray diffraction, energy dispersive X-ray spectroscopy, electron microscopy, and calorimetry. The postdoc
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. • Systematically optimize substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. • Characterize grown material using techniques such as x-ray
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than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology Mission
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structure to detect nanoscale sample changes from the smallest possible number of X-ray measurements. Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume