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using X-ray coherent diffractive imaging and nanofabrications methods in two inter-related sub-projects. In one the student will manufacture structured ferroelectric films for demonstration of our newly
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diffraction imaging modalities - topotomography, dark-field X-ray microscopy, and Bragg coherent diffraction imaging - has emerged over the past decade that can resolve 3D defect architectures and strain fields
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The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices. As the industry moves
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The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices. As the industry moves
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The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices. As the industry moves
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crucial information on material quality, structure, and chemistry, in particular when coupled with X-ray diffraction studies and low-temperature transport properties. Importantly, in situ TEM measurement
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analysis) advanced X-ray scattering: Total scattering, Pair Distribution Function (PDF), and Bragg Coherent Diffraction Imaging (at Institut Néel and ESRF) - (Identical-Location) Transmission Electron
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and implement advanced high-energy X-ray scattering and imaging methods Coordinate and execute experiments at the in-house beamline and at international synchrotron facilities Collaborate closely with
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Physics, Chemistry, Material Science, Geosciences or Engineering. Demonstrated experience with synchrotron x-ray techniques such as Bragg Coherent Diffraction Imaging (BCDI), X-ray Photon Correlation
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perform advanced synchrotron experiments to probe structural, chemical, and dynamic evolution of defects in thin films and heterostructures. Utilize techniques such as Bragg coherent diffraction imaging