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obtain the entire vibrational spectrum of a sample in a single laser pulse, and with ultrafast time resolution. This spectroscopy is forbidden in isotropic bulk media (e.g., liquids, gases, and solids
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RAP opportunity at National Institute of Standards and Technology NIST Neutron Detection and Spectroscopy Location Physical Measurement Laboratory, Radiation Physics Division opportunity
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Advancing the state of the art in measurements of sound, vibration, force, acceleration and velocity
RAP opportunity at National Institute of Standards and Technology NIST Advancing the state of the art in measurements of sound, vibration, force, acceleration and velocity Location Physical
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RAP opportunity at National Institute of Standards and Technology NIST Nanoscale Strain Measurement for Semiconductors and Advanced Materials Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Microbial “Dark Matter” Location Material Measurement Laboratory, Biosystems and Biomaterials Division opportunity location
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; Decision Making; Engineering; Infrastructure systems; Social systems; Metrics; Systems modeling; Social Science; Operations research; Mathematical programming; Optimization; Systems analysis; Risk analysis
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of measurements on microbiomes is generally poor. Improvements in measurement assurance tools will enable microbiome researchers to readily share and advance each other’s findings, allow federal agencies to safely
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Description With the advent of quantum technology, the landscape in the science of cryptography is changing. New cryptographic solutions need to keep pace with a technology that is based on fundamentally new
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RAP opportunity at National Institute of Standards and Technology NIST Computational Modeling of Progressive Structural Failure and Collapse Location Engineering Laboratory, Materials and
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RAP opportunity at National Institute of Standards and Technology NIST Functionalizing Semiconductor Surfaces Location Physical Measurement Laboratory, Nanoscale Device Characterization Division