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of the ligand. In this way, we propose to identify ligands of different sizes and negative charges that can be used to synthesize and characterize metallic molecular structures, taking into account the
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using X-ray and neutron diffraction Investigation of ionic transport by impedance spectroscopy and complementary electrochemical methods Determination of electronic, vibrational and vibronic structure
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than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Postdoctoral Researcher in Time-resolved X-ray Nanoimaging for Semiconductor Reliability Mission
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than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology 1 Mission
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subject. Proven experience with X-ray imaging/diffraction techniques, e.g. XRD-CT, 3D-XRD, µ/nanoCT, STXM or similar. Experience in computer programming for data analysis, e.g. Python. Demonstrated ability
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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(SEM): Electron Back- Scatter Diffraction (EBSD), Electron Channeling Contrast Imaging (ECCI), and other SEM-based modalities Expert on modalities in the transmission electron microscope (TEM
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, is a materials science beamline specialising in X-ray diffraction and full-field imaging techniques. The beamline serves a very wide user community, spanning physics and chemistry to medical science. A
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of inorganic and coordination compounds, including discrete complexes and related systems, using methods such as X-ray diffraction (XRD), thermogravimetric analysis (TGA), scanning electron microscopy (SEM) and
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the "send" (paper airplane) button to send the recommendation request email immediately after entering their information prior to submitting your application; if not, a request will automatically be sent when