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Field
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, Department of Civil and Mechanical Engineering, Section for Manufacturing Engineering, has a vacant postdoc position within the EIC Transition project Laboratory 4 Dimensional X-ray Diffraction for Sustainable
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8 Sep 2026 Job Information Organisation/Company European Synchrotron Radiation Facility Research Field Physics Researcher Profile Established Researcher (R3) Positions Postdoc Positions Application Deadline 8 Oct 2026 - 23:59 (Europe/Paris) Country France Type of Contract Temporary Job...
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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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through comparative X-ray diffraction analyses. The ultimate aim is to obtain a 3D reconstruction and refine the structural model by taking into account X-ray diffraction data (SAXS-WAXS) and the literature
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synthesis and melt crystal growth Structural characterization of the synthesized materials, including by X-ray diffraction Investigation of magnetic and thermodynamic low-temperature properties using standard
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, and in-situ X-ray diffraction; and evaluates phase transformations and microstructure-property relationships. Analyzes data, prepares reports, publications, presentations, and research deliverables
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partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction and synchrotron-based experiments, in
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spectroscopy). Knowledge of thin-film and materials characterization techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, atomic force microscopy, and scanning electron microscopy is required
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advanced correlative microscopy techniques, combining coherent X-ray diffraction imaging (CXDI) and STED super-resolution microscopy. The researcher will: • Develop new multimodal imaging strategies; • Work
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to optimize performances. The postdoc will carry out structural and morphological characterizations (X-ray diffraction, TOF-SIMS, AFM, and microscopy) of the selected superconducting materials. In the second