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. Investigating the etching mechanisms and selectivity of InP and InGaAlAs films as a function of plasma parameters using ellipsometry, XPS and AFM. 2. Developing an etching process for the multilayer stack meeting
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of the project NanoMuscles funded by the FNRS. The NanoChemistry & Molecular System group employs single-molecule techniques, AFM and optical tweezers, to study the operation of small synthetic molecules and
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surface metrology. It is relevant to have experience with analysis techniques such as AFM, WLI, contact-angle, XPS, infrared metrology. You will work in the XUV Optics group at the University of Twente
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the design and experimental characterization of micro- or nanoscale devices Experience in at least one of the following areas: scanning probe microscopy (AFM/STM), piezoelectric/resistive MEMS, low-noise
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, please visit the institute's website: https://www.is2m.uha.fr/ . The postdoctoral researcher will work within the Plasma Polymerization and Coatings team, under the scientific supervision of Dr. Aissam
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and biosensors using microscopic techniques. Measure properties with force spectroscopy. Apply magnetic force microscopy (MFM). Use Kelvin probe force microscopy (KPFM). Execute AFM assays in liquid
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as well as MSc and PhD programmes. Further information may be found at: http://www.kcl.ac.uk/physics About the role: We are seeking a highly motivated and experienced researcher, holding a PhD in
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 12 days ago
candidate with strong cleanroom fabrication tool experience, particularly in materials characterization methods such as ellipsometry, AFM, SEM, TEM, XRD, SIMS, or related techniques. Experience with
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for energetic transition” Research unit is coordinated by Dr. Angelica Chiodoni (https://adv-char.iit.it/ ), who has extensive experience in materials characterization, technologies for energy transition and
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supramolecular systems and of stimuli-responsive (e.g. photoswitchable) properties; familiarity with structural characterization of materials using X-ray (e.g. XRD, SAXS, WAXS) and/or microscopy (TEM, SEM, AFM