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Field
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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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: Design and conduct laboratory experiments. Characterize materials using advanced analytical techniques (XRD, SEM-EDS, ICP-OES/ICP-MS, FTIR, Raman and thermal analysis). Process and statistically analyse
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Thin-film fabrication, processing optimization, and experimental troubleshooting Materials characterization using techniques such as GIWAXS, Raman, FTIR, UV-vis, and electrical transport measurements
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electrochemistry, electrosynthesis, electrocatalysis), both theoretical and practical. Proficiency in spectroscopic techniques available at the laboratory (1H and heteronuclear NMR, 2D NMR, IR/Raman, UV-Vis, mass
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Salmonella and Campylobacter , and validating a rapid minimum inhibitory concentration (MIC) assay using surface-enhanced Raman spectroscopy (SERS). The postdoctoral researcher will be responsible
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Chemistry, thin films, and/or NMR spectroscopy is an advantage. - Proven hands-on experience with battery characterization techniques (at least some of the following): X-ray diffraction (XRD), Raman
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, Raman and impedance spectroscopy, X-ray diffraction, and complementary analytical techniques. The projects provide access to neutron and synchrotron facilities and are embedded in long-standing
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production. Familiarity with chemical-kinetic software such as Cantera, Chemkin, or equivalent tools. Experience with optical diagnostics such as laser-induced fluorescence, Raman spectroscopy, laser-induced
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. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform infrared
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or equivalent degree Hands-on experience in electrochemistry Hands-on experience in TEM Hands-on experience on EC_LPTEM Hands-on experience with one among XRD, Raman spectroscopy, IR spectroscopy, NAP-XPS, SECM