Sort by
Refine Your Search
-
NIST only participates in the February and August reviews. Bugs Framework (BF)-Based Formal Methods Systems for Proof of HW & SW Correctness or Existence of Bugs/Faults The Bugs Framework (BF) [1
-
pluripotent stem cell lines from the same individuals, could serve as reference samples for other ‘omics technologies as well. For example, this postdoc could take advantage of the extensive single molecule
-
Description We are seeking a NIST postdoctoral Fellow within the Materials Measurement Science Division . This postdoc will be a key member of a new project to develop an autonomous platform for developing and
-
are essential for broad adoption of these methods, this postdoc would collaborate with a unique array of technology and informatics developers in the Genome in a Bottle Consortium to develop authoritative de novo
-
. A key component of the project is high sensitivity magnetic scanning microscopy of these nano-objects, most likely using SQUID magnetometers. We are seeking a postdoc with background in scanning
-
, 2016 , and Microphysiol Syst. 2020 Jun; 4: 10.21037/mps-19-8 ) that will make toxic metabolite detection more sensitive. Recent work includes a new, pumpless liver/heart system. NRC postdocs can propose
-
. The postdoc will develop machine learning algorithms to analyze phenotype and sequence data, as well as active learning algorithms to optimize and control experiments in directed evolution. This position
-
are interested in postdoc candidates with prior experience in any of the following areas: ceramic processing, nano-particle synthesis, colloidal chemistry (i.e., rheological testing, zeta-potential), advanced
-
conducted in cooperation with the Joint Center for Quantum Information and Computer Science (QuICS) at the University of Maryland. key words Post-quantum cryptography; Quantum cryptography; Security proofs
-
Advancing the state of the art in measurements of sound, vibration, force, acceleration and velocity
quantification and minimization by optimized statistical and signal processing methods. Additionally, proposals for improvements in dynamical mechanical metrology that do not fit in one of the above topics may be