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in 44 graduate and 56 undergraduate programs. You are encouraged to visit the university web page at http://www.uis.edu . Application deadline: 9/28/2026 Minimum Starting Salary: $15.96 - $17.55 per
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3rd, 2026 Closing Date for Applications: August 23rd, 2026, 23h00m (Lisbon Time) Key words: #photonics #optics #setupdevelopment #nanofabrication #nanophotonics #quantumphotonics #FPGA Overview
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need to have basic computer skills and experience with programs such as Word and Excel. You will also spend time entering data, including working with numbers, so you will need to have a keen eye for
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» Electromagnetism Physics » Optics Physics » Other Researcher Profile First Stage Researcher (R1) Application Deadline 12 Oct 2026 - 21:59 (UTC) Country Switzerland Type of Contract Temporary Job Status Full-time Is
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(e.g., laser scanning, optical satellite imagery, radar, UAV, or aerial imaging). Strong programming and data analysis skills (e.g., Python and/or R), as well as proficiency in GIS software and
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discussions, diversity, and teamwork. Our research has connections to both condensed matter and quantum optics. For more detailed information see our group homepage: https://phys.au.dk/forskning
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about the total value of your benefits, please click on the following link: https://resources.uta.edu/hr/services/records/compensation-tools.php CBC Requirement It is the policy of The University of Texas
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20 Jun 2026 Job Information Organisation/Company AMOLF Research Field Physics » Optics Physics » Statistical physics Researcher Profile Recognised Researcher (R2) Application Deadline 16 Dec 2026
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members of the University of Illinois system. The University serves more than 4,000 students in 44 graduate and 56 undergraduate programs. You are encouraged to visit the university web page at http
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Warsaw University of Technology/Centre for Advanced Materials and Technologies, CEZAMAT | Poland | about 1 month ago
, lithography, plasma deposition, and thermal processes Development and execution of inter-process inspections, including scanning electron microscopy, optical microscopy, atomic force microscopy, ellipsometry