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, from semiconductor inspection and metrology, to cryogenic electron microscopy for biological samples. The cluster has access to state-of-the-art field-emission SEMs and FIB-SEMS, with a new microscope
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), photon emission microscopy (PEM), and focused ion beam (FIB) imaging - can be combined with AI to reconstruct nanoscale chip structures and infer functional behaviour from physical layouts. The
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, from semiconductor inspection and metrology, to cryogenic electron microscopy for biological samples. The cluster has access to state-of-the-art field-emission SEMs and FIB-SEMS, with a new
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high-pressure experiments Experience with nanoSIMS, FIB preparation, electron microscopy or related microanalytical techniques Interest in linking experimental results to models of planet formation
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positions are filled. For further details, please visit our website at https://slst.shanghaitech.edu.cn/main.htm Shanghai Institute for Advanced Immunochemical Studies (SIAIS) Shanghai Institute for
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volumetric and correlative imaging, X-ray imaging, cryogenic sample preparation, cryo-FIB/SEM and cryo-electron microscopy, together with quantitative image analysis and AI. You will lead the delivery
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, TEM, P-FIB, etc. Experience in the design and development of machine tools in metal forming processes Experience in using alternative, relevant modelling methods for material, process, and product