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Delft University of Technology (TU Delft) | Delft, Provincie Zuid-Holland | Netherlands | 10 days ago
, from semiconductor inspection and metrology, to cryogenic electron microscopy for biological samples. The cluster has access to state-of-the-art field-emission SEMs and FIB-SEMS, with a new microscope
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), photon emission microscopy (PEM), and focused ion beam (FIB) imaging - can be combined with AI to reconstruct nanoscale chip structures and infer functional behaviour from physical layouts. The
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Delft University of Technology (TU Delft) | Delft, Provincie Zuid-Holland | Netherlands | 10 days ago
, from semiconductor inspection and metrology, to cryogenic electron microscopy for biological samples. The cluster has access to state-of-the-art field-emission SEMs and FIB-SEMS, with a new
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