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electron lasers (XFEL). Optical phase change materials can be reversibly switched between amorphous and crystalline states on fast timescales and are enabling materials for emerging photonic computing
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geoscientist who will conduct research within the DecarbFaroe project (https://decarbfaroe.fo/ ), which is funded by the Research Council of Norway in the framework of the EU Clean Energy Transition Partnership
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eligibility, please visit: http://uhr.rutgers.edu/benefits/benefits-overview . Posting Summary The scientist will lead the Rutgers CryoEM & Nanoimaging Facility (RCNF), a regional core facility providing access
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activities in the field of microcrystal electron diffraction and take a lead role in the application of next-generation methods toward structure determination of key molecules in support of a diverse and
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, Raman, XRD, and TGA. For more information on School of Geography Earth and Environmental Sciences please visit our dedicated webpage at https://www.plymouth.ac.uk/schools Due to the nature of the role
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scanning probe and electron diffraction techniques for studying the adsorption of atoms, molecules and clusters on surfaces; commissioning and/or development of scientific instrumentation. programming skills
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-electron tomography and micro-electron diffraction. This new facility will further expand structural biology activities at the site complementing the Structural Biology Laboratory (SB Lab) of Elettra
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of spoken and written English ADDITIONAL SKILLS Experience on advanced electron microscopy, including techniques such advanced electron diffraction, mono-EELS, automated / programmable EM data acquisition
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Helmholtz-Zentrum Dresden-Rossendorf - HZDR - Helmholtz Association | Tremblay en France, le de France | France | 3 months ago
mechanical, electronic, and detector teams, to accomplish the tasks # Actively contribute to ongoing research within the MaLaR consortium # Ensure efficient data collection and data processing, particularly
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Knowledge: Experience with advanced microscopy techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), and nano/microindentation