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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | 6 days ago
that typical experimental characterization methods (e.g., electron backscatter diffraction, digital image correlation) provide only surface-level grain structure information, while the subsurface
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diffraction patterns alone, bypassing projection reconstruction? Can we reliably identify defects without ever resolving them? What is the best way to incorporate the known design information into the imaging
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. Research activities may include in-situ and ex-situ ion irradiation, corrosion and environmental testing, nano-indentation, transmission and scanning electron microscopy, electron backscatter diffraction
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synchrotron or laboratory 3D diffraction imaging is considered as a significant advantage. Excellent English communication skills are also essential As a formal qualification, you must hold a PhD degree (or
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(or similar): Coherent diffractive imaging, especially ptychography. Sparse sensing, optimization, or Bayesian experimental design. Machine learning for imaging. Synchrotron experiment experience. Semiconductor
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(or similar): Coherent diffractive imaging, especially ptychography. Sparse sensing, optimization, or Bayesian experimental design. Machine learning for imaging. Synchrotron experiment experience. Semiconductor
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(Rietveld refinement and PDF analysis), of Dr. Marie-Ingrid Richard’s group at CEA Grenoble, experts in Bragg Coherent Diffraction Imaging (BCDI) and of Dr. Frédéric Maillard group at LEPMI, which is
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materials science beamline specialising in X-ray diffraction and full-field imaging techniques. The beamline serves a very wide user community, spanning physics and chemistry to medical science. A significant
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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using the Advanced Photon Source (APS) and other characterization techniques such as scanning electron microscopy (SEM) and powder diffraction. This is a one-year appointment centered on the development