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. Bert Koopmans, based at Eindhoven University of Technology. PhD candidate 1 will explore fundamental processes underlying the deterministic creation and annihilation of sub-diffraction limited skyrmions
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. The mechanisms governing the growth of Sn on InAs and other III-V semiconductors remain poorly understood. Imaging Sn/InAs interfaces at atomic resolution using a transmission electron microscope (TEM) gives
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electron diffraction, imaging and spectroscopy, in collaboration with colleagues performing material syntheis and complementary measurements at partner locations in France and Germany. Optimizing electron
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for materials, taking advantage of a recently installed ThermoFisher Spectra 300 S/TEM equipped with an “ultimono” monochromator, capable of an energy resolution better than 30 meV, image and probe correctors
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an open research position for a talented and motivated researcher. Motivation Conventional cameras capture two-dimensional images, even though our world is three-dimensional (3D). This lack of depth
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I supervise computational projects in electron microscopy imaging for investigating materials at atomic resolution. Some projects centre on analysing experimental data acquired by experimental
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PhD Scholarship in University Students’ Learning Via Digital Twins of Neutron Scattering Instruments
. The digital twins will allow students to perform virtual experiments. ACCESS will make digital twins for ESS instruments on imaging (ODIN), inelastic scattering (BIFROST), small-angle scattering (LOKI) and
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plasma dynamics in strongly excited materials. A complementary part involves coherent diffractive imaging and holographic techniques for the spatio-temporal characterization of transient laser-induced
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" this imaging technique by bringing transformative TE techniques, including electron diffraction, low-energy STEM, and phase-contrast imaging, to compact, affordable, and widely accessible SEM platforms. As a PhD
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the form of coatings, ablation and high-heat-flux testing rigs, and characterisation using secondary electron imaging, X-ray diffractometry, electron backscattered diffraction, transmission electron