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diffraction patterns alone, bypassing projection reconstruction? Can we reliably identify defects without ever resolving them? What is the best way to incorporate the known design information into the imaging
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(or similar): Coherent diffractive imaging, especially ptychography. Sparse sensing, optimization, or Bayesian experimental design. Machine learning for imaging. Synchrotron experiment experience. Semiconductor
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(or similar): Coherent diffractive imaging, especially ptychography. Sparse sensing, optimization, or Bayesian experimental design. Machine learning for imaging. Synchrotron experiment experience. Semiconductor
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