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Field
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diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), electrochemical impedance spectroscopy (EIS), and cyclic voltammetry (CV
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etc). Advanced characterization of steels, for example transmission electron microscopy and electron backscatter diffraction (EBSD). Mechanical property testing. Materials modelling, with experience
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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French National Institute for Health Research (INSERM) | Toulouse, Midi Pyrenees | France | 2 months ago
microscopy and live-cell imaging provide essential insights into tumour biology, invasion, and treatment response. Current techniques overcome the diffraction limit (~200 nm) and enable the visualization
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Postdoc (f/m/d) at Rossendorf Beamline at the ESRF / Completed PhD in Physics, Chemistry, Materia...
Helmholtz Association of German Research Centres | Tremblay en France, le de France | France | 2 months agowith synchrotron-based experiments (proven by relevant publications as a first/corresponding author) # Solid experience in analysisng X-ray spectroscopy and X-ray diffraction data using quantum
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, vapor transport, flux growth, Bridgman growth, and related methods. Additional desirable qualifications include expertise in crystal structure determination using X-ray diffraction; experience with bulk
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, including the use of structural and spectroscopic characterisation techniques such as X-ray diffraction, UV-Vis spectroscopy, microscopy and other advanced materials characterisation techniques. Furthermore
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to experimentally derived disorder models and data from methods such as total scattering/pair distribution function analysis, diffuse scattering, diffraction, solid-state NMR and electron microscopy. Work closely
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using the Advanced Photon Source (APS) and other characterization techniques such as scanning electron microscopy (SEM) and powder diffraction. This is a one-year appointment centered on the development
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provide improved techniques and/or methods. We work heavily with industrial and academic partners to improve these measurements. Crystallographic texture; Phase fraction; Electron backscatter diffraction