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their characterization because of the high spatial resolution. Recently, the development of the so-called four-dimensional scanning-TEM (4D-STEM) has raised interest in electron diffraction (ED). We aim to explore
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. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform infrared
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