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Field
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using the Advanced Photon Source (APS) and other characterization techniques such as scanning electron microscopy (SEM) and powder diffraction. This is a one-year appointment centered on the development
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FieldPhysicsYears of Research Experience1 - 4 Additional Information Eligibility criteria -The candidate should have demonstrated experience in the synthesis, characterization (X-ray diffraction (XRD
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astronomical nitriles. • Performing data analysis including vibrational spectroscopy, mass spectrometry, X-ray and neutron diffraction crystallography. Perform supporting computations such as DFT calculations
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. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform infrared
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of faceted, nonspherical granular particles. This multi-PI project integrates graph/network theory, granular mechanics, 3D X-ray diffraction and imaging, and discrete element method simulations. The successful
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performance for structural biology projects. The lab has access to a HighFlux X-ray diffraction system, specifically a Rigaku MicroMax-007 HF, a second-generation microfocus rotating anode generator, and a
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electrochemical testing. Operation of X-ray diffraction (XRD) instrumentation for phase identification and crystal structure analysis. Support in the characterization of materials using complementary analytical
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metallurgy or additive manufacturing; characterisation using advanced electron microscopy and x-ray diffraction techniques; mechanical testing using macro/micro-mechanical methods and failure investigation
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X-ray diffraction (XRD). Project leadership: Proven ability to manage complex experimental workplans and meet deliverables in a collaborative research environment. Sustainable mindset: A commitment to
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physicochemical characterization using techniques such as: Powder X-ray diffraction (PXRD), Infrared (IR) spectroscopy, Thermogravimetric analysis (TGA), Gas adsorption measurements, Scanning electron microscopy