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RAP opportunity at National Institute of Standards and Technology NIST Entangled-Photons for Quantum Networking Location Information Technology Laboratory, Applied and Computational Mathematics
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NIST only participates in the February and August reviews. Given the exponential increases in wireless demand, future generation networks will need to leverage higher frequencies (30 to 300 GHz) in
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Advancing the state of the art in measurements of sound, vibration, force, acceleration and velocity
information into neural networks for modeling dynamic systems; use of uncertainty information to improve the performance of sensor-network based measurements employing machine learning; uncertainty
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computing systems, and artificial neural network-based architectures. key words Artificial neural network; Neuromorphic; magnetic Josephson junctions; Josephson junctions; Single flux quantum; Spintronics
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RAP opportunity at National Institute of Standards and Technology NIST Neural Net Deep-learning for Magnetic Resonance Image Reconstruction and Diagnosis Location Physical Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Leveraging Artificial Neural Networks for Enhancing GC and LC-MS Metabolomics Data Interpretation and Integration Location
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for fabricating near-net-shape metallic parts and generating microstructures that are infeasible with conventional metallurgy. However, the degree of commercial adoption of AM parts is impeded by
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properties to them, generates a finite element mesh, and performs virtual measurements. The goal is to build a computational platform that can predict the macroscopic behavior of a material from knowledge of
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. Appl. 21, 054028 (2024). M. W. Daniels et al., Neural Networks Three Ways: Unlocking Novel Computing Schemes Using Magnetic Tunnel Junction Stochasticity, in Spintronics XVI, Vol. 12656 (SPIE, 2023), pp
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301.975.6050 Jan Obrzut [email protected] 301.975.6845 Description As part of a collaborative NIST-wide program involving structural characterization, modeling, and high-throughput microwave measurement, we