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Field
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for parameter estimation, degradation prediction, and analysis of electrochemical and structural characterization data, including X-ray CT image reconstruction, segmentation and quantitative microstructure
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The Surface Scattering and Microdiffraction (SSM) group in the X-ray Science Division (XSD) at the Advanced Photon Source (APS), Argonne National Laboratory is seeking Two Postdoctoral Appointees
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. Essential Function Yes Percentage of Time 10 Job Duty Conduct catalyst and device characterization using microscopy, X-ray techniques, spectroscopy, and electrochemical methods to verify catalyst structures
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or more of the following areas: - Recombinant protein expression and purification. - Biochemical and biophysical characterization of proteins and protein–nucleic acid complexes. - X-ray crystallography and
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of inorganic and coordination compounds, including discrete complexes and related systems, using methods such as X-ray diffraction (XRD), thermogravimetric analysis (TGA), scanning electron microscopy (SEM) and
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), knowledge of MOF material research techniques, including at least powder X-ray diffraction (PXRD), spectroscopic techniques (FT-IR, NMR, UV-vis), sorption techniques (particularly gas physisorption), and
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The Advanced Photon Source (APS) POLAR beamline is seeking a Postdoctoral Appointee to develop and employ advanced high-pressure instrumentation for x-ray spectroscopy and scattering techniques
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Perform advanced characterization using synchrotron-based X-ray techniques to investigate material behavior and interfacial chemistry during synthesis and battery operation Develop mechanistic understanding
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and/or sodium-ion battery technologies Familiarity with reference-electrode cell configurations Experience with electron microscopy, X-ray diffraction, and other advanced materials and battery
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. Excellent core instrumentation and state of the art facilities for NMR spectroscopy and mass spectrometry, X-ray crystallography and mass spectrometry with full time support staff are available on site