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of wildtype and Bdf1-mutant C. albicans strains. The project will also involve developing high-resolution 3D X-ray imaging approaches to investigate morphotype-dependent changes in the nuclear and subcellular
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Massachusetts Institute of Technology | Cambridge, Massachusetts | United States | about 2 months ago
observations of galaxy clusters, with a focus on XRISM data to measure the line-of-sight ICM velocity structure; •Characterization of X-ray imaging detectors and supporting electronics, including testbed design
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The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices. As the industry moves
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The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices. As the industry moves
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The performance of X-ray microscopy has improved significantly over the last decade, enabling synchrotron-based X-ray imaging to resolve individual transistors in modern semiconductor devices. As the industry moves
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experience in radio data analysis, optical/IR spectroscopy, space-based imaging analysis (optical/X-rays), and other time-domain science are encouraged to apply. Resources include programs with HST, Chandra
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for electrode and composite fabrication. Analytical facilities include X-ray diffractometers, UV-Vis (including in-flow configurations), Raman and FTIR spectrometers, surface area and particle size analyzers
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automated extraction of morphological features (e.g., porosity, tortuosity, connectivity) and fluid flow characteristics from 2D and 3D images resulting from magnetic resonance, X‑ray and electron images
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fabrication. Analytical facilities include X-ray diffractometers, UV-Vis (including in-flow configurations), Raman and FTIR spectrometers, surface area and particle size analyzers, electrochemical
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National Aeronautics and Space Administration (NASA) | Hampton, Virginia | United States | 6 days ago
characterization of metallic materials (e.g., synchrotron X-ray diffraction, computed tomography, electron backscatter diffraction, digital image correlation). Point of Contact Mikeala Eligibility Requirements