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Field
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materials science beamline specialising in X-ray diffraction and full-field imaging techniques. The beamline serves a very wide user community, spanning physics and chemistry to medical science. A significant
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particularly valuable. Documented experience in materials characterization, such as NMR spectroscopy, mass spectrometry, X-ray diffraction, X-ray photoelectron spectroscopy, vibrational spectroscopy, and
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FieldPhysicsYears of Research Experience1 - 4 Additional Information Eligibility criteria -The candidate should have demonstrated experience in the synthesis, characterization (X-ray diffraction (XRD
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(<0.2 pg Pb blanks); and a recently installed triple-quadrupole ICP-MS (ICP-MS/MS). Electron Microbeam and X-ray Diffraction Facility (EMXDF): A state-of-the-art facility for micro-analytical
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Postdoc (f/m/d) at Rossendorf Beamline at the ESRF / Completed PhD in Physics, Chemistry, Materia...
Helmholtz Association of German Research Centres | Tremblay en France, le de France | France | about 2 months agowith synchrotron-based experiments (proven by relevant publications as a first/corresponding author) # Solid experience in analysisng X-ray spectroscopy and X-ray diffraction data using quantum
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micro-CT, ultrasonic methods, and x-ray-based characterization Contribute to hardware and software development for experimental platforms Process, interpret, and manage large datasets Present research
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total scattering, WAXS and SAXS, imaging, and femtosecond X ray diffraction to probe structure and dynamics in real time under device relevant conditions. Target facilities include DESY, MAX IV, European
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characterization by x-ray diffraction and electron microscopy. Proficiency in other languages of the consortium: Italian, Czech, German Experience preparing scientific reports, presentations, or publications
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-tube synthesis, mechanical alloying, spark plasma sintering); • Crystal structure determination and microstructural characterization (X-ray diffraction, electron microscopy, spectroscopy
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diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), electrochemical impedance spectroscopy (EIS), and cyclic voltammetry (CV