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refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based on powder diffraction, neutron diffraction, or
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refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based on powder diffraction, neutron diffraction, or
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synthesis XRD diffraction analysis by single crystal and powder X-ray diffraction Photoluminescence Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR5256-ADEMES-007/Default.aspx
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Your Job Lead the conceptual design, simulation, and implementation of a unique high-energy X-ray beamline for long-term operando investigations of energy materials Develop and optimize advanced X
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); • Implementing partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction and synchrotron
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multidimensional techniques) •High-resolution mass spectrometry •Single-crystal X-ray diffraction •UV–Vis spectroscopy •Steady-state and time-resolved fluorescence spectroscopy •Electrochemical analysis
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focused on graphite processing and critical mineral recovery from alloys. Characterize solid/liquid samples using X-ray diffraction (XRD), X-ray fluorescence (XRF), Fourier-Transform Infrared
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thermodynamics, phase equilibria, reaction kinetics, mass transport, and/or interfacial phenomena in materials. Demonstrated track record with materials characterization techniques such as X-ray diffraction
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Helmholtz-Zentrum Berlin für Materialien und Energie | Berlin, Georgia | United States | about 1 month ago
science or geosciences Sound knowledge of crystallography Experience with diffraction methods (X-ray diffraction) and data analysis Extensive experience in the planning, execution, and analysis of
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; 5. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform