Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
photonics. New faculty will have access to the Institute’s shared facilities, including a cleanroom, electron microscopy, x-ray facility, and electrical and optical characterization, and to the MonArk NSF
-
interprets experimental structural data from amorphous thin films, including X-ray total-scattering, pair-distribution-function (PDF), and related diffraction/scattering measurements, and integrate
-
of experience). Demonstrated track record of scientific software development. Preferred Qualifications: Experience with diffraction for materials analysis using either x-rays or neutrons. Experience developing
-
. Perform comprehensive material characterization—including optical and electron microscopy, X-ray diffraction, inductive heating, magnetometry, scanning probe analysis, and other techniques based on project
-
laboratories: the Institut de Chimie Moléculaire-ICMG for NMR spectroscopy, mass spectrometry (MS), X-ray diffraction, and EPR. The development of artificial photosynthesis systems for water splitting and CO
-
of microstructural characterization techniques, including optical microscopy, scanning electron microscopy (SEM), X-ray diffraction (XRD), thermal analysis, and mechanical testing, is preferred, Experience in surface
-
. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
-
IVPT performance. The work will employ thermal analysis and X-ray diffraction for crystallinity and polymorphism, as well as spectroscopic and microscopic techniques such as confocal Raman spectroscopy
-
physicochemical characterization using techniques such as: Powder X-ray diffraction (PXRD), Infrared (IR) spectroscopy, Thermogravimetric analysis (TGA), Gas adsorption measurements, Scanning electron microscopy
-
crucial information on material quality, structure, and chemistry, in particular when coupled with X-ray diffraction studies and low-temperature transport properties. Importantly, in situ TEM measurement