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Field
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parameters shape microstructure and cell performance. You will operate and optimise high-temperature, high-pressure synthesis; characterise materials by SEM/TEM, XRD, Raman, thermal and gas analysis; and
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metallic additive manufacturing, including powder bed fusion technologies experience in advanced materials characterisation techniques such as SEM, EBSD, TEM, PFIB and atom probe tomography strong knowledge
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fluorescence microscopy, Confocal laser scanning microscopy, Cryo-TEM and/or TEM, SEM, DLS, NTA, Zeta potential, SAXS/SANS, Fluorescence spectroscopy…). Experience in quantitative image analysis and microscopy
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diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), electrochemical impedance spectroscopy (EIS), and cyclic voltammetry (CV
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· demonstrated expertise in advanced microscopy and microanalysis techniques, particularly atom probe tomography (APT) · experience with complementary characterisation techniques such as TEM, SEM, EBSD and
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structure–property relationships and advancing the understanding of these novel catalytic systems. Perform electron microscopy analyses, including transmission electron microscopy (TEM) and in situ TEM
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characterization techniques, such as SEM, TEM, EBSD, XRD, and related methods. Experience preparing specimens using techniques and tools such as electropolishing, flash polishing, and focused ion beam methods
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micromechanical behavior under loading conditions (e.g., tension, compression, creep). Perform detailed microstructural characterization using SEM, EBSD, TEM, XRD, and related techniques. Analyze lattice strain
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 19 days ago
candidate with strong cleanroom fabrication tool experience, particularly in materials characterization methods such as ellipsometry, AFM, SEM, TEM, XRD, SIMS, or related techniques. Experience with
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. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform infrared