Sort by
Refine Your Search
-
Listed
-
Category
-
Employer
-
Field
-
than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Postdoctoral Researcher in Time-resolved X-ray Nanoimaging for Semiconductor Reliability Mission
-
than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Post-doc on formal verification and algorithm discovery for numerical analysis About us and our
-
, with the possibility of renewal, in the field of Analysis and Partial Differential Equations (PDEs). Job description - The successful candidate will collaborate on research projects related
-
Your position You will work on projects investigating plastic responses to climatic challenges and the evolutionary constraints that limit adaptation to extreme climatic conditions. We address these questions using populations and species sampled along elevational gradients, providing a powerful...
-
human stress, motivation, immersive behavioral testing and computational analysis, as well as from interactions with VR, engineering and data-analysis support structures at EPFL and in the Lausanne/Geneva
-
an interdisciplinary team. Your tasks Conduct physical vapor deposition experiments using advanced PVD processes such as synchronized HiPIMS Perform in-depth materials characterization and surface analysis Apply and
-
Conduct physical vapor deposition experiments using advanced PVD processes such as synchronized HiPIMS Perform in-depth materials characterization and surface analysis Apply and improve high-throughput
-
. Olga Fink ). IMOS develops advanced machine-learning and AI methods for complex engineering and industrial systems, with a particular focus on improving their reliability, availability, and operational
-
machine-learning and AI methods for complex engineering and industrial systems, with a particular focus on improving their reliability, availability, and operational performance while enabling more
-
a small fraction of the sample voxels need to be re-measured to detect the change, rather than the complete 3D volume. Microchip samples are also highly structured, with known design rules, which can