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PhD Position: High resolution Transmission Electron Imaging in Scanning Electron Microscopy Job description Scanning Electron Microscopy (SEM) is one of the most widely used imaging tools in
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for high-aspect-ratio vertical interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and
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interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and sustainability: less material waste, better energy
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fluent in English. The following work or research experience will be an advantage: experience with cementitious materials, XRD with Rietveld analysis, SEM, TG, DSC, micro-CT, particle size analysis
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knowledge of building materials and be fluent in English. The following work or research experience will be an advantage: experience with cementitious materials, XRD with Rietveld analysis, SEM, TG, DSC
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immobilization, support development and functionalization and related analytical techniques including TEM, SEM good knowledge (reading, speaking, writing) of English and Romanian; a good understanding of
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nanostructures. You will fabricate your own samples in the clean room (thin-film deposition, electron-beam and photolithography, and SEM/FIB-based 3D nanostructuring) and probe their static and dynamic response
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sputtering, plasma analysis, as well as thin film characterization techniques like XRD, SEM, TEM, or XPS is beneficial. Fluent English spoken and written is required. Your workplace The Thin Film Physics
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, structural, and vacuum-based characterization, including SEM/EDS, profilometry/AFM, spectroscopy, cathodoluminescence, and EUV emission measurements. Support simulations, data analysis, experimental records
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identification of exchange networks from local to extra-regional scales. The doctoral candidate is expected to conduct metallographic examinations and chemical characterizations (primarily SEM-EDS and LA-ICP-MS