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for high-aspect-ratio vertical interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and
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interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and sustainability: less material waste, better energy
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fluent in English. The following work or research experience will be an advantage: experience with cementitious materials, XRD with Rietveld analysis, SEM, TG, DSC, micro-CT, particle size analysis
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knowledge of building materials and be fluent in English. The following work or research experience will be an advantage: experience with cementitious materials, XRD with Rietveld analysis, SEM, TG, DSC
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sputtering, plasma analysis, as well as thin film characterization techniques like XRD, SEM, TEM, or XPS is beneficial. Fluent English spoken and written is required. Your workplace The Thin Film Physics
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experience from PVD synthesis methods, like magnetron sputtering, plasma analysis, as well as thin film characterization techniques like XRD, SEM, TEM, or XPS is beneficial. Fluent English spoken and written