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Field
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microstructural characterization by OM, SEM/EDS, XRD, and complementary techniques. Heat treatments to evaluate microstructural stability. Microhardness and compression testing, correlating processing
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characterization (e.g., XRD, SEM, TEM, BET, spectroscopy techniques) to establish structure-property relationships. Evaluate materials in gas and vapor adsorption-based applications, including toxic gas capture and
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: Design and conduct laboratory experiments. Characterize materials using advanced analytical techniques (XRD, SEM-EDS, ICP-OES/ICP-MS, FTIR, Raman and thermal analysis). Process and statistically analyse
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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and plants at multiple scales, has been applying 3D electron microscopy (FIB-SEM) in this field, thanks to the technological environment of IRIG and its collaboration with IBS. This work has led
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characterization techniques, such as SEM, TEM, EBSD, XRD, and related methods. Experience preparing specimens using techniques and tools such as electropolishing, flash polishing, and focused ion beam methods
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fluorescence microscopy, Confocal laser scanning microscopy, Cryo-TEM and/or TEM, SEM, DLS, NTA, Zeta potential, SAXS/SANS, Fluorescence spectroscopy…). Experience in quantitative image analysis and microscopy
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micromechanical behavior under loading conditions (e.g., tension, compression, creep). Perform detailed microstructural characterization using SEM, EBSD, TEM, XRD, and related techniques. Analyze lattice strain
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 6 days ago
candidate with strong cleanroom fabrication tool experience, particularly in materials characterization methods such as ellipsometry, AFM, SEM, TEM, XRD, SIMS, or related techniques. Experience with
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. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform infrared